Please use this identifier to cite or link to this item: https://hdl.handle.net/10419/44900 
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dc.contributor.authorDanguy, Jérômeen
dc.contributor.authorde Rassenfosse, Gaétanen
dc.contributor.authorvan Pottelsberghe de la Potterie, Brunoen
dc.date.accessioned2011-04-13T09:59:00Z-
dc.date.available2011-04-13T09:59:00Z-
dc.date.issued2009-
dc.identifier.citation|aEIB Papers|c0257-7755|v14|h1|nEuropean Investment Bank (EIB)|lLuxembourg|y2009|p170-195en
dc.identifier.urihttp://hdl.handle.net/10419/44900-
dc.description.abstractThis paper re-visits the empirical failure to establish a clear link between R&D efforts and patent counts at the industry level. It is claimed that the 'propensity-to-patent' concept should be split into an 'appropriability propensity' and a 'strategic propensity'. The empirical contribution is based on a unique panel dataset composed of 18 industries in 19 countries over 19 years. The results confirm that the R&D-patent relationship is affected by research productivity, appropriability propensity and strategicpropensity factors. The observed increase in the propensity to file patents is much stronger for supranational (that is, triadic or regional) patents than for national priority filings, suggesting that the current patent hype is essentially the result of a globalization phenomenon.en
dc.language.isoengen
dc.publisher|aEuropean Investment Bank (EIB) |cLuxembourgen
dc.subject.ddc330en
dc.subject.stwIndustrielle Forschungen
dc.subject.stwInnovationen
dc.subject.stwPatenten
dc.subject.stwEU-Staatenen
dc.subject.stwJapanen
dc.subject.stwUSAen
dc.titleThe R&D-patent relationship: An industry perspective-
dc.typeArticleen
dc.identifier.ppn862707471en
dc.rightshttp://www.econstor.eu/dspace/Nutzungsbedingungenen
econstor.citation.journaltitleEIB Papersen
econstor.citation.issn0257-7755en
econstor.citation.volume14en
econstor.citation.issue1en
econstor.citation.publisherEuropean Investment Bank (EIB)en
econstor.citation.publisherplaceLuxembourgen
econstor.citation.year2009en
econstor.citation.startpage170en
econstor.citation.endpage195en

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