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Erscheinungsjahr: 
1997
Schriftenreihe/Nr.: 
ZEW Discussion Papers No. 97-30
Verlag: 
Zentrum für Europäische Wirtschaftsforschung (ZEW), Mannheim
Zusammenfassung: 
We explore the tail of patented invention value distributions by using value estimates obtained directly from patent holders. The paper focuses on those full-term German patents of the application year 1977 which were held by West German and U.S. residents. The most valuable patents in our data account for a large fraction of the cumulative value over all observations. Several tests are conducted to pin down more precisely the nature of the high-value tail distribution. Among the Pareto, Singh-Maddala and log normal distributions, the log normal appears to provide the best fit to our patented invention value data.
Schlagwörter: 
Patents
Skew Distributions
JEL: 
O31
O34
Dokumentart: 
Working Paper

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