Please use this identifier to cite or link to this item: http://hdl.handle.net/10419/24251
Authors: 
Scherer, Frederic M.
Harhoff, Dietmar
Vopel, Katrin
Year of Publication: 
1997
Series/Report no.: 
ZEW Discussion Papers 97-30
Abstract: 
We explore the tail of patented invention value distributions by using value estimates obtained directly from patent holders. The paper focuses on those full-term German patents of the application year 1977 which were held by West German and U.S. residents. The most valuable patents in our data account for a large fraction of the cumulative value over all observations. Several tests are conducted to pin down more precisely the nature of the high-value tail distribution. Among the Pareto, Singh-Maddala and log normal distributions, the log normal appears to provide the best fit to our patented invention value data.
Subjects: 
Patents
Skew Distributions
JEL: 
O31
O34
Document Type: 
Working Paper

Files in This Item:
File
Size
142.22 kB





Items in EconStor are protected by copyright, with all rights reserved, unless otherwise indicated.