@misc{Hautsch2008Yield,
abstract = {We introduce a Nelson-Siegel type interest rate term structure model with the underlying yield factors following autoregressive processes revealing time-varying stochastic volatility. The factor volatilities capture risk inherent to the term struc- ture and are associated with the time-varying uncertainty of the yield curve's level, slope and curvature. Estimating the model based on U.S. government bond yields applying Markov chain Monte Carlo techniques we find that the yield factors and factor volatilities follow highly persistent processes. Using the extracted factors to explain one-year-ahead bond excess returns we observe that the slope and cur- vature yield factors contain the same explanatory power as the return-forecasting factor recently proposed by Cochrane and Piazzesi (2005). Moreover, we identify slope and curvature risk as important additional determinants of future excess returns. Finally, we illustrate that the yield and volatility factors are closely con- nected to variables reflecting macroeconomic activity, inflation, monetary policy and employment growth. It is shown that the extracted yield curve components have long-term prediction power for macroeconomic fundamentals.},
address = {Berlin},
author = {Nikolaus Hautsch and Yangguoyi Ou},
copyright = {http://www.econstor.eu/dspace/Nutzungsbedingungen},
keywords = {C5; E4; G1; 330; Term structure modelling; yield curve risk; stochastic volatility; factor models; macroeconomic fundamentals; Rendite; Zinsstruktur; Volatilit\"{a}t; Stochastischer Prozess; Faktorenanalyse; Zinsstrukturtheorie; Makro\"{o}konomischer Einfluss; Theorie; \"{O}ffentliche Anleihe; Risikopr\"{a}mie; USA},
language = {eng},
number = {2008,053},
publisher = {SFB 649, Economic Risk},
series = {SFB 649 discussion paper},
title = {Yield curve factors, term structure volatility, and bond risk premia},
url = {http://hdl.handle.net/10419/25296},
year = {2008}
}