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|Title:||Development programs for one-shot systems using multiple-state design reliability models |
Vardeman, Stephen B.
|Issue Date:||2003 |
|Series/Report no.:||Technical Report // Universität Dortmund, SFB 475 Komplexitätsreduktion in Multivariaten Datenstrukturen 2003,43|
|Abstract:||Design reliability at the beginning of a product development program is typically low and development costs can account for a large proportion of total product cost. We consider how to conduct development programs (series of tests and redesigns) for one-shot systems (which are destroyed at first use or during testing). In rough terms, our aim is to both achieve high final design reliability and spend as little of a fixed budget as possible on development. We employ multiple-state reliability models. Dynamic programming is used to identify a best test-and-redesign strategy and is shown to be presently computationally feasible for at least 5-state models. Our analysis is flexible enough to allow for the accelerated stress testing needed in the case of ultra-high reliability requirements, where testing otherwise provides little information on design reliability change.|
multiple-state design reliability
|Document Type:||Working Paper|
|Appears in Collections:||Technical Reports, SFB 475, TU Dortmund|
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