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Title:Development programs for one-shot systems using multiple-state design reliability models PDF Logo
Authors:Shevasuthislip, Suntichai
Vardeman, Stephen B.
Issue Date:2003
Series/Report no.:Technical Report // Universität Dortmund, SFB 475 Komplexitätsreduktion in Multivariaten Datenstrukturen 2003,43
Abstract:Design reliability at the beginning of a product development program is typically low and development costs can account for a large proportion of total product cost. We consider how to conduct development programs (series of tests and redesigns) for one-shot systems (which are destroyed at first use or during testing). In rough terms, our aim is to both achieve high final design reliability and spend as little of a fixed budget as possible on development. We employ multiple-state reliability models. Dynamic programming is used to identify a best test-and-redesign strategy and is shown to be presently computationally feasible for at least 5-state models. Our analysis is flexible enough to allow for the accelerated stress testing needed in the case of ultra-high reliability requirements, where testing otherwise provides little information on design reliability change.
Subjects:development programs
one-shot systems
multiple-state design reliability
test
redesign
optimal programs
dynamic programming
accelerated testing
Document Type:Working Paper
Appears in Collections:Technical Reports, SFB 475, TU Dortmund

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