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http://hdl.handle.net/10419/24251
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| Title: | | Exploring the Tail of Patented Invention Value Distributions  |
| Authors: | | Scherer, Frederic M. Harhoff, Dietmar Vopel, Katrin |
| Issue Date: | | 1997 |
| Series/Report no.: | | ZEW Discussion Papers 97-30 |
| Abstract: | | We explore the tail of patented invention value distributions by using value estimates obtained directly from patent holders. The paper focuses on those full-term German patents of the application year 1977 which were held by West German and U.S. residents. The most valuable patents in our data account for a large fraction of the cumulative value over all observations. Several tests are conducted to pin down more precisely the nature of the high-value tail distribution. Among the Pareto, Singh-Maddala and log normal distributions, the log normal appears to provide the best fit to our patented invention value data. |
| Subjects: | | Patents Skew Distributions |
| JEL: | | O31 O34 |
| Document Type: | | Working Paper |
| Appears in Collections: | | Publikationen von Forscherinnen und Forschern des ZEW ZEW Discussion Papers
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| dp3097.pdf | | 142.22 kB | Adobe PDF |
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