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Title:Exploring the Tail of Patented Invention Value Distributions PDF Logo
Authors:Scherer, Frederic M.
Harhoff, Dietmar
Vopel, Katrin
Issue Date:1997
Series/Report no.:ZEW Discussion Papers 97-30
Abstract:We explore the tail of patented invention value distributions by using value estimates obtained directly from patent holders. The paper focuses on those full-term German patents of the application year 1977 which were held by West German and U.S. residents. The most valuable patents in our data account for a large fraction of the cumulative value over all observations. Several tests are conducted to pin down more precisely the nature of the high-value tail distribution. Among the Pareto, Singh-Maddala and log normal distributions, the log normal appears to provide the best fit to our patented invention value data.
Subjects:Patents
Skew Distributions
JEL:O31
O34
Document Type:Working Paper
Appears in Collections:Publikationen von Forscherinnen und Forschern des ZEW
ZEW Discussion Papers

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